Auger ion spectroscopy

См. также в других словарях:

• Auger electron spectroscopy — (AES; Auger pronounced|oːʒeː in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. Underlying the spectroscopic technique is the Auger effect, as it has come… …   Wikipedia

• ion-induced Auger electron spectroscopy — joninio sužadinimo Ožė elektronų spektroskopija statusas T sritis radioelektronika atitikmenys: angl. ion induced Auger electron spectroscopy vok. Auger Elektronenspektroskopie unter Ionenerregung, f rus. электронная оже спектроскопия с ионным… …   Radioelektronikos terminų žodynas

• Auger-Elektronenspektroskopie unter Ionenerregung — joninio sužadinimo Ožė elektronų spektroskopija statusas T sritis radioelektronika atitikmenys: angl. ion induced Auger electron spectroscopy vok. Auger Elektronenspektroskopie unter Ionenerregung, f rus. электронная оже спектроскопия с ионным… …   Radioelektronikos terminų žodynas

• spectroscopy — spectroscopist /spek tros keuh pist/, n. /spek tros keuh pee, spek treuh skoh pee/, n. the science that deals with the use of the spectroscope and with spectrum analysis. [1865 70; SPECTRO + SCOPY] * * * Branch of analysis devoted to identifying… …   Universalium

• X-ray photoelectron spectroscopy — [ right|thumb|350px|Basic components of a monochromatic XPS system.] X ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state… …   Wikipedia

• Low-energy ion scattering — LEIS redirects here; for the Hawaiian garland see Lei (Hawaii). Low energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface sensitive analytical technique used to characterize the …   Wikipedia

• Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… …   Wikipedia

• Electron spectroscopy — is an analytical technique to study the electronic structure and its dynamics in atoms and molecules. In general an excitation source such as x rays, electrons, or synchrotron radiation will eject an electron from an inner shell orbital of an… …   Wikipedia

• spectroscopie Auger par induction ionique — joninio sužadinimo Ožė elektronų spektroskopija statusas T sritis radioelektronika atitikmenys: angl. ion induced Auger electron spectroscopy vok. Auger Elektronenspektroskopie unter Ionenerregung, f rus. электронная оже спектроскопия с ионным… …   Radioelektronikos terminų žodynas

• Ultraviolet photoelectron spectroscopy — (UPS) refers to the measurement of kinetic energy spectra of photoelectrons emitted by ultraviolet photons, to determine molecular energy levels in the valence region.If Einstein’s photoelectric law is applied to a free molecule, the kinetic… …   Wikipedia

• surface analysis — ▪ chemistry Introduction       in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… …   Universalium